Browse Items

Viewing items matching the following properties:

• manufacturer : FEI  [x]
• Organisational Unit : School of Aeronautical, Automotive, Chemical and Materials Engineering  [x]

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  DualBeam (FIB-SEM) Microscope System

  The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
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  • Technique: Scanning electron microscopy
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  Helios G4 PFIB UXe DualBeam Microscope

  PFIB UXe DualBeam Microscope for Materials Science.
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  • Technique: Microscopy
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  Transmission Electron Microscope

  Field emission gun transmission electron microscope (FEG-TEM) / Scanning transmission electron microscope (STEM) with chemical analysis system.
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  • Technique: Transmission Electron Microscopy